Oxide Reliability: A Summary Of Silicon Oxide Wearout, Breakdown, And Reliability
Finna-arvio
Oxide Reliability: A Summary Of Silicon Oxide Wearout, Breakdown, And Reliability
Tallennettuna:
| Kieli |
englanti |
|---|---|
| Julkaisija |
World Scientific Publishing Company,
2002
|
| ISBN |
981-02-4842-3 981-277-806-3 |
| Hae kokoteksti | |