%0 Electronic Book %A Kelly, Joe %A Engelhardt, Michael %A Engelhardt, M. %I Artech %D 2006 %G eng %@ 1-58053-709-X %@ 1-58053-710-3 %T Advanced Production Testing of RF, SoC, and SiP Devices %U http://sfx.finna.fi/nelli19?url_ver=Z39.88-2004&ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&rfr_id=info:sid/sfxit.com:opac_856&url_ctx_fmt=info:ofi/fmt:kev:mtx:ctx&sfx.ignore_date_threshold=1&rft.object_id=1000000000411870&svc_val_fmt=info:ofi/fmt:kev:mtx:sch_svc& %U https://hamk.finna.fi/Record/nelli19.1000000000411870