Oxide Reliability: A Summary Of Silicon Oxide Wearout, Breakdown, And Reliability
Finna-arvio
Oxide Reliability: A Summary Of Silicon Oxide Wearout, Breakdown, And Reliability
Tallennettuna:
Kieli |
englanti |
---|---|
Julkaisija |
World Scientific Publishing Company,
2002
|
ISBN |
981-02-4842-3 981-277-806-3 |
Hae kokoteksti |