VLSI Test Principles and Architectures
Finna-arvio
VLSI Test Principles and Architectures
Tallennettuna:
Kieli |
englanti |
---|---|
Julkaisija |
Burlington
Morgan Kaufmann,
2006
|
ISBN |
0-12-370597-5 1-4933-0086-5 9786610966844 1-280-96684-X 0-08-047479-9 |
Hae kokoteksti |